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Atomic force microscopy (AFM)
Atomic force microscopy is used to measure the nanoscale surface roughness, study the surface morphology, grain size analysis, determination of pileup and crack length after nanoindentation. Measurements can be done both in contact and non-contact modes and magnetic force mode.
Make: CSM Instrument (ANTON PARR Tritec)
Specifications:
Probe radius: > 10 nm
Scan area limits: 1 μm x 1 μm to 40 μm x 40 μm
Maximum in Z axis: 4 μm
