SPECTROSCOPIC ELLIPSOMETRIC CHARACTERIZATION OF TIALN/TIALON/SI3N4 TANDEM...

Spectroscopic ellipsometric characterization of TiAlN/TiAlON/Si3N4 tandem...

Spectroscopic ellipsometric characterization of TiAlN/TiAlON/Si3N4 tandem absorber for solar selective applications, A. Biswas, D. Bhattacharya, H. C. Barshilia, N. Selvakumar, K. S. Rajam, Applied Surface Science, 254 (2008) 1694-1699, doi: 10.1016/j.apsusc.2007.07.109