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Scanning Electron Microscope (SEM)
Image formation in an SEM is accomplished through collection of the secondary electrons / back scattered electrons generated due to interaction of an electron beam with the material of the specimens. The characteristic X-rays generated from the specimens during this interaction are used for elemental analysis.
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Model:EVO 18 Research Manufacturer:Carl Zeiss, UK Resolution:15 nm in SE mode Operating Parameters:0.2 to 30 kV accelerating voltage and 0.5 pA to 5 µA probe current |
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